ECE seminar: Test Chip Design and Data Analytics for Yield Learning in 7nm Semiconductor Technologies

Please join us as we welcome visiting speaker Dr. Shawn Blanton, Trustee Professor of Electrical and Computer Engineering at Carnegie Mellon University.

This seminar will be part II of a two-part series. In part II, Dr. Blanton will give a seminar on January 15th from 12-1pm on his research in The Advanced Chip Test Laboratory (ACTL) which develops and implements data-mining techniques for improving the operation, design, manufacturing and testing of integrated systems. Our research involves data-mining algorithm development, data analysis, chip design and fabrication in collaboration with various industrial partners that currently include IBM, NVIDIA, Qualcomm, CISCO Systems, Intel, GlobalFoundries, and ARM.
This will be located in LSRC D106. Lunch will be served at 11:45am